2nd International Workshop on Combinatorial Testing

Event Dates

Mar 22, 2013 - Mar 22, 2013

Location

Luxembourg

Submission Deadline

Jan 14, 2013

(Workshop in conjunction with ICST 2013)

We invite submissions of high-quality papers presenting original work on both theoretical and experimental aspects of combinatorial testing. We accept both full papers (up to 10 pages) and short papers (up to 4 pages). Topics of interest include, but are not limited to:

Combinatorial testing workflow

Modeling the input space for CT

Efficient algorithms to generate t-way test suites, especially involving support of constrains

Determination of expected system behavior for each test case

Executing CT test suites

Combinatorial testing based fault localization

Implementation of CT with existing testing infrastructures

Handling changes in test requirements

Applicability of combinatorial testing

Comparison and combination of CT with other dynamic verification methods

Investigation of historical records of failures to determine the kind of CT which may have detected underlying faults

Empirical studies and feedback from practical applications of CT

Combinatorial testing for concurrent and real-time systems

CT for testing cloud computing systems and use of combinatorial methods in cloud architecture

Application of CT in other domains, e.g., study of gene regulation and other biotechnology applications

Combinatorial and complementing methods

Combinatorial analysis of existing test suites

Test plan reduction and completeness

CT and coverage metrics – combining the two, and studying the relationship between them

Papers must be submitted before the deadline and according to submission guidelines