IEEE NMDC is a flagship conference series of the IEEE Nanotechnology Council (NTC), focusing on research advances in the fields of nanoscience and nanotechnology.
The IEEE Nanotechnology Council (NTC) has made the decision to transition IEEE NMDC 2025 to a fully virtual conference. This change ensures we continue to deliver a high-quality, engaging experience for all participants without disruption.
Stay tuned for updates on how you can join us online to connect, share, and advance nanotechnology research globally.
Conference Scope:
The conference focuses on the latest scientific and technological advances related to
* Nanorobotics and nanomanufacturing
* Nano-biomedicine
* Nanofabrication
* Nano-Optics, Nanophotonics, and Nano-Optoelectronics
* Spintronics
* Nanoelectronics
* Nanosensors and Nanoactuators
* MEMS/NEMS
* Nanoelectronics
* Nano-fluidics and integrated bio-chips
* Nanomaterials
* Nanometrology and Characterization
* Modeling and Simulation
* Nanopackaging
* Nanomagnetics
* Nanoenergy, Environment and Safety
* Nano-acoustic Devices, Processes & Materials
* Quantum, Neuromorphic & Unconventional Computing
* Emerging Plasma Nanotechnologies
* Education in nanotechnology
* Ethics in Nanotechnology
* Commercializing nanotechnology
* Fundamentals and applications of nanotubes, nanowires, quantum dots and other low dimensional materials
Paper submission:
Submit abstracts and papers at https://nano.papercept.net/conferences/scripts/start.pl. Be sure to select “NMDC’25”.
Key Dates:
Full Paper Submission: 14 July 2025
Paper Decisions: 1 August 2025
Final Paper Submissions: 1 September 2025
Presentation-Only Abstract Submissions: August 1, 2025
Abstract Decisions: 15 August 2025
Final Abstract Submissions: 1 September 2025
Special Invited Session Proposals: 14 July 2025
Special Invited Session Abstract/Paper Submission: 1 August 2025
Early-Bird Registrations: 8 September 2025
Upload Pre-recorded Presentations: 20 September 2025
Accepted and presented full papers (4 to 6 pages) for IEEE NMDC 2025 will be included in IEEE Xplore® as well as other Abstracting & Indexing (A&I) databases.