21th IEEE International Conference on Microelectronics

Event Dates

Dec 19, 2009 - Dec 22, 2009

Location

Marrakech, Morocco

Submission Deadline

Jun 28, 2009

The 21th IEEE technically co-sponsored International Conference on Microelectronics ICM’09 will be held in Marrakech, Morocco. ICM’ 09 is held in cooperation with Ecole Mohammadia d’Ingenieurs and the University of Waterloo.

ICM has been held in numerous countries across the Middle East and Asia over the past 20 years. ICM 2009 will include oral, poster sessions and tutorials given by experts in state-of-the-art topics.

The regular technical program will run for three days. In addition, tutorial sessions will be held on the first day of the conference. Papers are solicited in, but not limited to, the following topics:

1- Circuits and Systems

* Analog and RF circuit design techniques

* Digital Signal and data processing

* Wireless communication systems

* Nonlinear circuits

* Systems on Chip (SoCs)

* VLSI for signal and Image processing

* Integrated antenna and front-end co-design

* Signal Processing in Communications

2- Computer-Aided Design

* Simulation (process, device, circuit, logic, timing,functional)

* Layout (placement, routing, floor planning, symbolic, ERC, DRC)

* Silicon optimization

* Parallel embeded systems

* Testing: formal verification

* CAD for FPGAs

* High level synthesis tools

* Design for testability

3- Micro / Nanoelectronics

* Device characterization and modeling

* Device physics and novel structures

* Process technology, CMOS, BJT,BiCMOS, GaAs

* Reliability and failure analysis

* Optoelectronics

* MEMS Devices

* Packaging, surface mount technology

* Others

Perspective authors are invited to submit full length (four pages) papers, in IEEE format, for presentation in any of the areas listed above using the instructions for paper submission. Only electronic submissions will be accepted via the EDAS online submission system.

Accepted papers will be published in the electronic Conference Proceedings (CD ROM) and included in IEEE XPLORE database