5th International Workshop on Combinatorial Testing

Event Dates

Apr 10, 2016 - Apr 10, 2016

Location

Chicago, USA

Submission Deadline

Jan 15, 2016

We invite submissions of high-quality papers presenting original work on both theoretical and experimental aspects of combinatorial testing.

Topics of interest for papers or posters include, but are not limited to:

* **Combinatorial testing workflow**

* Modeling the input space for CT

* Efficient algorithms to generate t-way test suites, especially involving support of constraints

* Determination of expected system behavior for each test case

* Executing CT test suites

* Combinatorial testing based fault localization

* Implementation of CT with existing testing infrastructures

* Handling changes in test requirements

* **Real-world experience in deployment of combinatorial testing**

* Empirical studies and feedback from practical applications of CT

* Evaluation and ROI metrics to assess the degree of usefulness of CT

* Methodology used for test space modeling and determination of interaction coverage requirements

* Discussion of challenges and open problems in the application of CT in industrial settings

* **Applicability of combinatorial testing**

* Comparison and combination of CT with other dynamic verification methods

* Study of failure records to determine the kind of CT which may have detected faults

* Combinatorial testing for concurrent and real-time systems

* Cloud computing systems testing and use of combinatorial methods in cloud architecture

* Application of CT in other domains, e.g. biotech applications, mechanical engineering, security, etc.

* Combinatorial testing, feature models, and software product lines

* **Combinatorial and complementing methods**

* Combinatorial analysis of existing test suites

* Test plan reduction and completeness

* CT and coverage metrics – combining the two, and studying the relationship between them